Performance and Resource Utilization for Video Test Pattern Generator v8.2

Vivado Design Suite Release 2025.1

Interpreting the results

This page contains maximum frequency and resource utilization data for several configurations of this IP core. The data is separated into a table per device family. In each table, each row describes a test case. The columns are divided into test parameters and results. The test parameters include the part information and the core-specific configuration parameters. Any configuration parameters that are not listed have their default values; any parameters with a blank value are disabled or set automatically by the IP core. Consult the product guide for this IP core for a list of GUI parameter and user parameter mappings.

• Resource figures are taken from the utilization report issued at the end of implementation using the Out-of-Context flow in Vivado Design Suite.
• The Out-of-Context IP constraints include HD.CLK_SRC properties as required to ensure correct hold timing closure: these properties are enabled using the Tcl command: set_param ips.includeClockLocationConstraints true
• Maximum frequency is measured using the Out-of-Context flow to synthesize and implement the IP instance in isolation. This ensures that the design is not distorted in order to route to device pins.
• Maximum frequency is the result of a binary search of attempted clock period constraints. The reported figure is the highest frequency at which the design met timing.
• LUT figures do not include LUTs used as pack-thrus, but do include LUTs used as memory.
• Default Vivado Design Suite 2025.1 settings were used. You may be able to improve on these figures using different settings. Because surrounding circuitry will affect placement and timing, no guarantee can be given that these figures will be repeatable in a larger design.

Data is provided for the following device families:

• Versal ACAP
• Zynq UltraScale+

Versal ACAP

Zynq UltraScale+

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